diff options
author | Keuin <[email protected]> | 2022-04-16 19:08:28 +0800 |
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committer | Keuin <[email protected]> | 2022-04-16 19:08:28 +0800 |
commit | 60d8221109304bc4f207dda8a42623cae488af5d (patch) | |
tree | 5f4c59a81d58d14666226ee1f7da5299db98f9f5 /material_dielectric.cpp | |
parent | 52d11df35ca9846085b910e2e40434b48847d9d8 (diff) |
Move trace logging to tracelog.h.
Pixel-wise, comprehensive, beautiful trace logging.
Diffstat (limited to 'material_dielectric.cpp')
-rw-r--r-- | material_dielectric.cpp | 3 |
1 files changed, 3 insertions, 0 deletions
diff --git a/material_dielectric.cpp b/material_dielectric.cpp index ed8e4eb..61e34ec 100644 --- a/material_dielectric.cpp +++ b/material_dielectric.cpp @@ -3,6 +3,7 @@ // #include "material_dielectric.h" +#include "tracelog.h" bool material_dielectric::scatter(ray3d &r, const object &hit_obj, double hit_t, random_uv_gen_3d &ruvg) const { const auto hit_p = r.at(hit_t); @@ -22,9 +23,11 @@ bool material_dielectric::scatter(ray3d &r, const object &hit_obj, double hit_t, // determine reflection or refraction using Schlick's Approximation. if (reflectance(cos1, ri_) > ruvg.range01_scalar()) { // reflect + TRACELOG(" reflect (dielectric material, schlick, ri=%-10f)\n", ri_); r2 = n.reflect(r.direction()); } else { // refract + TRACELOG(" refract (dielectric material, schlick, ri=%-10f)\n", ri_); r2 = n.refract<true>(r.direction(), ri_); } r.direction(r2.unit_vec()); |